Kumar, Arun and Aggarwal, Sanjeev and Singh, Mahavir (2024) Structural, Morphological, and Optical Study of the Fe-doped ZnO Thin Film. In: Current Perspective to Physical Science Research Vol. 7. B P International, pp. 1-9. ISBN 978-81-970571-6-8
Full text not available from this repository.Abstract
Fe-doped ZnO Dilute Magnetic Semiconductor (DMS) thin film prepared by R F magnetron sputtering on a glass substrate and the Influence of Fe-doping at 3% on structural, morphological, and optical properties has been studied. The X-ray Diffraction (XRD) analysis shows that Fe doping has a significant effect on crystalline structure, grain size, and strain in the thin film. Crystalline structure is obtained for 3% Fe doping as observed from Atomic Force Microscopy (AFM) and X-ray Diffraction (XRD). UV-visible spectroscopy was used to study the optical behavior of the thin films.
| Item Type: | Book Section |
|---|---|
| Subjects: | Institute Archives > Physics and Astronomy |
| Depositing User: | Managing Editor |
| Date Deposited: | 17 Feb 2024 06:40 |
| Last Modified: | 17 Feb 2024 06:40 |
| URI: | http://eprint.subtopublish.com/id/eprint/4096 |
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